Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress

نویسندگان

  • Tudor Chirila
  • Winfried Kaindl
  • T. Reimann
  • Michael Rüb
  • U. Wahl
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015